PCE RT 2200 21 Parameter Profilometer Surface Roughness Tester

Highlights:

• Large graphic OLED display
• Rechargeable battery
• Storage of up to 20 measurements
• Extensive number of parameters
• Micro-USB interface for charging and exporting data.
  

The PCE RT 2200 21 Parameter Profilometer Surface Roughness Tester with its large OLED display is particularly suitable for quick and precise measurements in the workshop or laboratory. This device uses a DSP chip for control and data processing at high speed and with low energy consumption. In addition, you have a large selection of measurement parameters for the roughness measuring device: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry (JIS), Rz (JIS), RP (ASME), Rpm (ASME ), Rv (ASME), R3z, R3zmax, Rz1max, Rmr (c), Rdc, Rmr.

The measurements are automatically stored in the internal memory of the unit. The stored data can then be transferred to a PC via the micro-USB interface on the roughness measuring device and analyzed using the software. It is also possible to have the data displayed on the OLED display of the roughness measuring device after a measurement. Even the wave course can be shown on the display of the roughness meter.

It often happens that the contact surface of the test piece is too small for a roughness measuring device to position the roughness measuring device appropriately for a measurement. For such cases, a positioning adapter is included with this roughness measuring device. As such, this roughness measuring device also allows for measurements on small samples.

Features:

• Selection of 21 parameters
• Large graphic OLED display
• Fast and accurate measurement
• 3 different cut-off wavelengths
• Micro-USB interface for PC connection
• Storage of 20 measurement curves

Specifications:

• Parameters: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry(JIS), Rz(JIS), RP(ASME), Rpm(ASME), Rv(ASME), R3z, R3zmax, Rz1max, Rmr(c), Rdc, Rmr.
• Measuring range:
• Ra, Rq, Rc: 0.005 - 16 µm
• Rsm: 5 - 1000 µm
• Rsk: -1 - 1
• Rz, Rt, Rp, Rv, Rmax, Ry(JIS), Rz(JIS),RP(ASME),
• Rpm(ASME), Rv(ASME), R3z, R3zmax, Rz1max,
• Rdc: 0.02 - 200 µm Rmr(c), Rmr: 0 ... 100 %
• Probe tip radius: 5 µm
• Probe tip material: diamond, 90° angled
• Max.recommended force: 4 mN (0.4 gf)
• Measuring principle: inductive
• Radius of the longitudinal guide rail: 45 mm
• Standards: ANSIB46.1/ASMEB46.1 (DIN EN ISO 4287)
• Maximum travel distance: 15 mm
• Cut off wavelength: 0.25 mm / 0.8 mm / 2.5 mm
• Scanning speed:
• 0.135 mm/s at cutoff wavelength: 0.25 mm
• 0.5 mm/s at cutoff wavelength: 0.8 mm
• 1 mm/s at cut-off wavelength: 2.5 mm
• Return speed: 1 mm/s
• Memory: 20 measurement runs with all parameters
• Measurement accuracy: <±10 %
• Repeatability: <6 %
• Display: OLED
• Units: µm / µinch (switchable)
• Interface: Micro USB
• Power supply: rechargeable Li-ion battery

What’s included:

• 1 x Profilometer PCE-RT 2200
• 1 x Micro probe
• 1 x Protective cap for probe
• 1 x Positioning device
• 1 x Calibration plate
• 1 x Roughness standard
• 1 x USB cable
• 1 x Charging adapter
• 1 x Carrying case
• 1 x Instruction manual

 PCE-RT 2200 User Manual

 PCE-RT 2200 Data Sheet

 Need more info? Please contact us or go to the PCE Resource Center.